HIGH EFFICIENT SOLUTION FOR SEMICONDUCTOR
SEMICONDUCTOR AND FPD INSPECTION
LAXCO LWI SERIES SEMICONDUCTOR AND FPD INSPECTION MICROSCOPES
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LAXCO LWI SERIES INSPECTION SCOPES
Pioneering optical system excellence and headquartered just outside Seattle, Laxco has been at the forefront of precision optics and microscopy for over 20 years, redefining what's possible across science, industry, and education. From classrooms to clinics, from research labs to manufacturing lines, our systems empower critical missions with unmatched innovation, reliability, and true American craftsmanship.
The Laxco LWI Series Inspection Scopes are engineered for high-precision inspection of semiconductors, chips, and flat panel displays. Manufactured to the rigorous requirements and quality standards that define Laxco excellence, the LWI Series delivers reliable performance for today's advanced inspection environments.
Semiconductor
Inspection
FPD Inspection
Wafer Inspection
Up to 300 mm
LAXCO LWI-800 SERIES
INSPECTION MICROSCOPE
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The system adopts an advanced optical system incorporating precision-engineered lenses and optimized optical pathways to achieve high resolution, low distortion, and improved signal-to-noise performance across the full operating range.
LAXCO LWI SERIES INSPECTION SCOPES
Equipped with versatile, variable-size wafer holders supporting 4", 6°, 8", and 12" wafers, the LWI800/LWI1200 models provide exceptional flexibility for both wafer and flat panel display (FPD) inspection. These systems accommodate wafers up to 300 mm in diameter and FPDs up to 17 inches, meeting the demands of cutting-edge manufacturing and quality control applications. An enhanced ergonomic design improves operator comfort while enabling faster, more intuitive operation, maximizing productivity, accuracy, and inspection efficiency.
Multiple Optional
Splitting Ratios
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Equipped with the MX8R wide-field optical imaging system, delivering a maximum field of view up to 26.5 mm.
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Trinocular head supports two selectable splitting ratios (100:0 or 0:100), enabling full(100%) image output either to the eyepieces or to the camera.
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Trinocular head also offers three selectable splitting ratios (100:0, 20:80, or 0:100), allowing simultaneous dual-channel imaging with 20% output to the eyepieces and 80% to the camera.
Stable, All-metal Frame
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The all-metal frame features a low center of gravity, high structural rigidity, and enhanced stability. making it ideal for professional industrial inspection applications and ensuring consistently stable, high-clarity imaging.
High-performance Nosepiece
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The high-performance nosepiece incorporates a precision bearing system, enabling smooth and lightweight operation, accurate repositioning, and controlled concentricity for reliable and repeatable performance.
Long-Travel Mechanical Stage
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Engineered for high repeatability, smooth movement, and long-term reliability in demanding industrial applications.
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8-inch three-layer mechanical stage - Dimensions: S25 mm x 330 mm;Moving range: 210 mm x 210 mm, Designed for precision industrial inspection of wafers, FPDs, circuit packages, PCBs, materials, cast metal or ceramic parts, and abrasive tools.
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Optional 6-inch stage - Dimensions:445 mm x 240 mm; Moving range:156 mm x 158 mm, offering a compact alternative without compromising stability or accuracy.
Nomarski Differential
Interference Contrast
(DIC) System
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Equipped with a high-performance DIC attachment, subtle height variations that are difficult to detect under bright-field illumination are converted into high-contrast, three-dimensional relief images.
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Widely used for the inspection of LCD conductive particles and the detection of surface scratches on precision disks.
Versatile Imaging Modes
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PCD (dark field)
Metallurgical structure (DIC)
Metallurgical structure (polarizing)
Optimized for Critical Inspection Applications​
Semiconductor Inspection
Wafer Inspection
FPD/LCD
Quality Control & Failure Analysis
R&D and Metrology
Frequently Asked Questions
What is the Laxco LWI Series?
The Laxco LWI Series are high-performance inspection microscopes engineered for semiconductor, wafer, IC package, PCB, and Flat Panel Display (FPD) inspection. They deliver exceptional optical performance, precision, and reliability for advanced industrial applications.
What is a semiconductor inspection microscope?
A semiconductor inspection microscope is designed to examine wafers, chips, and electronic components for defects, contamination, and manufacturing quality. It provides the high-resolution imaging needed for quality control, process verification, and failure analysis.
What applications is the LWI Series designed for?
The LWI Series is ideal for semiconductor inspection, wafer inspection, FPD/LCD inspection, PCB inspection, IC package inspection, materials analysis, quality control, and failure analysis.
What microscope is best for semiconductor inspection?
The best semiconductor inspection microscope combines high-resolution optics, precision mechanics, and flexible imaging capabilities. The Laxco LWI Series is engineered to deliver accurate, repeatable inspections for semiconductor manufacturing and quality assurance.
What wafer sizes does the LWI Series support?
The LWI-800 and LWI-1200 Series support interchangeable wafer holders for 4-inch, 6-inch, 8-inch, and 12-inch (300 mm) wafers, providing flexibility for a wide range of inspection applications.
Can the LWI Series inspect Flat Panel Displays (FPDs)?
Yes. The LWI Series supports Flat Panel Display (FPD) and LCD inspection for panels up to 17 inches, making it ideal for electronics manufacturing and display quality control.
What industries use semiconductor inspection microscopes?
The LWI Series is used in semiconductor manufacturing, electronics production, research laboratories, materials science, aerospace, medical device manufacturing, and quality control facilities.
What makes the LWI optical system different?
The advanced optical system features precision-engineered lenses that deliver high-resolution, low-distortion images with excellent contrast and clarity, making it easier to detect even the smallest defects.
Can the LWI Series be customized for specific inspection applications?
Yes. The LWI Series offers configurable options, accessories, and imaging solutions to meet the specific requirements of semiconductor, electronics, and industrial inspection workflows.
What accessories are available for the LWI Series?
Optics:
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Nomarski Differential Interference Contrast (DIC) System with sextuple nosepiece, with DIC slot
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Infinity Corrected Brightfield Semi-Apochromatic DIC Objectives 5x, 10x, 20x, 50x, 100x
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Plan Semi- Apochromatic Infrared Objectives 5x, 10x, 20x, 50x
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Polarizer & 360° rotatable analyzer
Stage:
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Optional 6-inch stage
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8" Wafer holder(For 6"/8" wafers)
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6" Wafer holder(For 4"/5"/6" wafers)​
Camera:
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Wide Spectrum Dedicated Infrared Camera
Where are Laxco inspection microscopes manufactured?
Laxco inspection microscopes are designed, assembled, and quality-tested in Mill Creek, Washington, USA.
